High Resolution Transmission Electron Microscope

09/11/2021 - 04:34 PM

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Technical parameters

Accelerating voltage: 200kV
Incandescent: LaB6
Resolution: 0.24 nm for point; 0.14 nm for lattice constant
Scanning TEM: 1 nm of resolution
Magnification: 2,000 - 1,500,000

Applications

Chracterizing microstructure, morphology, size of matter phases by high resolution transmission electron microscopy (HR - TEM)
Chracterizing crystal structures of matter phases by selected region electron diffraction (SEAD)
Take pictures of the morphology and size of matter phases using light/dark field scanning transmission electron images
Obtaining chemical element distribution spectra of matter phases by energy dispersive X-ray (EDX)
Collecting spectra and images of chemical element distribution of matter phases by pixel/line/area/mapping transmitted through scanning combined with scattered energy X-ray (STEM - EDX)

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Main Research Equipments

Field Emission Scanning Electron Microscope

Spark Plasma Sintering (SPS) Furnace

Lithography Equipment (URE 2000S)

High Resolution Photoluminescent Microscope

Spectroscopic Ellipsometry (UVISEL Plus Horiba)

Highlights Information

HIGHLIGHTS
Scientific research, technology development, application and transfer of science and technology products and services; international cooperation and training in the field of materials science and technology and other related fields.

28 + Year of establishment
Established on June 11, 1993
240 + staffs
3 Professors, 9 Associate Professors, 13 Senior Researchers, 80 Ph.
Arwards
First Class Labor Medal