Field Emission Scanning Electron Microscope
09/11/2021 - 04:13 PM 370 views
Technical parameters
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Secondary electronic image resolution:
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1.0 nm (15kV, WD = 4nm)
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1.4 nm (1 kV, WD = 1.5 nm)
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Magnification Low magnification type 20 - 2000 times
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High magnification pattern 100 - 800000 times ·
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Transmissive electronic probe for STEM-style imaging ·
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The EMAX ENERGY (EDX) system enables elemental analysis in the μm size region
Applications
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Determination of morphology, structure, size, elemental composition of samples in the form of blocks, thin films, powders.