Scanning Probe Microscopy
13/11/2021 - 04:18 PM 34 views
Technical parameters
-
Resolution: 2 Å - 7 Å
-
Scanning’s area: 10 Å2 - 100 mm2
-
Scan mode: Contact, non contact, tapping
Applications
-
Observe the surface morphology, thickness and roughness of samples (thin film, bulk for conductive and insulating samples).
-
Observe the surface morphology, thickness, roughness and domains of magnetic samples.