X-ray Diffractometer

09/11/2021 - 04:18 PM 385 views

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X-ray Diffractometer Equinox 5000 is used to study in the phase crystals analysis, structure, and degree of crystallinity of materials, crystalline size for nanomaterials.

Technical parameters

X-ray source: Radiation Cu-Ka; l = 1,54056 Ǻ; Generator: 3500 W.
Detector: SPS120, gas C2H4/Ar = 15/85.
2Theta: 120°.
High temperature in-situ: T = 20-1600°C
Cooling water: 3,5 L/min; T = 18-25°C
Databases: ICDD PDF2, PDF4

Applications

X-ray diffraction measurements for powder, bulk, film and liquid samples at room temperature.
In-situ X-ray diffraction measurements at high temperature (T = 20-1600°C) for powder, bulk and film samples.
Modes: fixed, with or without sample rotation; Reﬂection or transmission mode.
Search match and quantification, crystal structure analysis, microstructure analysis.
Phase transition, dynamic studies.
Free open database: ICDD PDF2, PDF4 data library.

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Main Research Equipments

High Resolution Transmission Electron Microscope

Field Emission Scanning Electron Microscope

Spark Plasma Sintering (SPS) Furnace

Lithography Equipment (URE 2000S)

High Resolution Photoluminescent Microscope

Spectroscopic Ellipsometry (UVISEL Plus Horiba)

Light source parameters measuring system (Everfine YT1000)

HIGHLIGHTS
Scientific research, technology development, application and transfer of science and technology products and services; international cooperation and training in the field of materials science and technology and other related fields.

28 + Year of establishment
Established on June 11, 1993
240 + staffs
3 Professors, 9 Associate Professors, 13 Senior Researchers, 80 Ph.
Arwards
First Class Labor Medal